Aberration-Corrected Analytical Transmission Electron Microscopy
Product ID: 0470518510
Condition: New
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Product Description
Aberration-Corrected Analytical Transmission Electron Microscopy
The book is concerned with the theory, background, and practical use of transmission electron microscopes with lens correctors that can correct the effects of spherical aberration. The book also covers a comparison with aberration correction in the TEM and applications of analytical aberration corrected STEM in materials science and biology. This book is essential for microscopists involved in nanoscale and materials microanalysis especially those using scanning transmission electron microscopy, and related analytical techniques such as electron diffraction x-ray spectrometry (EDXS) and electron energy loss spectroscopy (EELS).
Technical Specifications
Country
USA
Brand
Wiley
Manufacturer
Wiley
Binding
Hardcover
ItemPartNumber
20695
ReleaseDate
2011-09-23T00:00:01Z
UnitCount
1
EANs
9780470518519








