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CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies (Frontiers in Electronic Testing, 40)

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CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies (Frontiers in Electronic Testing, 40)

The monograph will be dedicated to SRAM (memory) design and test issues in nano-scaled technologies by adapting the cell design and chip design considerations to the growing process variations with associated test issues. Purpose: provide process-aware solutions for SRAM design and test challenges.
Country USA
Brand Springer
Manufacturer Springer
Binding Hardcover
ItemPartNumber 23539913
Model 23539913
ReleaseDate 2008-06-21
UnitCount 1
EANs 9781402083624

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