Digital Oscilloscope DSO TC3 3 in1 Handheld Storage

Digital Oscilloscope DSO TC3 3 in1 Handheld Storage Oscilloscope Transistor Tester Table for Capacitance and Testing (High Configuration)
- Multi Interface Screen Display: The oscilloscope can test different functions and support multi interface screen display. With keypad design, it is more convenient to operate and select different test function modes.
- Sine Waveform Frequency Output: The generator has 5 built in basic waveforms, sine waveform frequency output 1‑10KHz 0‑3.3V 50%, vertical sensitivity 10mV to 10V , horizontal time base range 1us‑10s, more waveform data can be obtained per unit time, thus making the waveform more accurate.
- Convenient and 3 in 1: This digital oscilloscope, electronic component tester, and PWM generator function, combined into one. The oscilloscope has a sampling rate and a bandwidth of 500 kHz. Voltage up to 400V can be measured.
- Identify Device Type: Oscilloscope mode can test the waveform of the circuit, while Mos test mode can test various types of transistors, which can identify device type, pin polarity, hFE, on state voltage, junction capacitance, resistance, inductive components, etc. generator mode, you can use sine, pulse, triangular or ramp waveform.
- Screen: The oscilloscope is powered by a built in 1500 mA battery, which will be fully charged in 1‑2 hours via a 5V 2A adapter and can operate for 4 hours (green indicator for completion/red indicator for charging). The digital handheld pocket oscilloscope and transistor tester is designed with a high resolution 2.4 inch screen with adjusting backlight. Better reading experience and easy to use.
Country USA
Brand Eujgoov
Manufacturer Eujgoov
ItemPartNumber Eujgoovra6gh5cdoe-12
Model Eujgoovra6gh5cdoe-12
ReleaseDate 0000-00-00

Country	USA
Brand	Eujgoov
Manufacturer	Eujgoov
ItemPartNumber	Eujgoovra6gh5cdoe-12
Model	Eujgoovra6gh5cdoe-12
ReleaseDate	0000-00-00

Digital Oscilloscope DSO TC3 3 in1 Handheld Storage Oscilloscope Transistor Tester Table for Capacitance and Testing (High Configuration)

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