ESD: Failure Mechanisms and Models

Electrostatic discharge (ESD) failure mechanisms continue to impactsemiconductor components and systems as technologies scale frommicro- to nano-electronics.

This book studies electrical overstress, ESD, and latchup from afailure analysis and case-study approach. It provides a clearinsight into the physics of failure from a generalist perspective,followed by investigation of failure mechanisms in specifictechnologies, circuits, and systems. The book is unique in coveringboth the failure mechanism and the practical solutions to fix theproblem from either a technology or circuit methodology.

Look inside for extensive coverage on:

• failure analysis tools, EOS and ESD failure sources and failuremodels of semiconductor technology, and how to use failure analysisto design more robust semiconductor components and systems;
• electro-thermal models and technologies; the state-of-the-arttechnologies discussed include CMOS, BiCMOS, silicon on insulator(SOI), bipolar technology, high voltage CMOS (HVCMOS), RF CMOS,smart power,  gallium arsenide (GaAs), gallium nitride (GaN),magneto-resistive (MR) , giant magneto-resistors (GMR), tunneling magneto-resistor (TMR),  devices; microelectro-mechanical (MEM) systems, and  photo-masks andreticles; 
• practical methods to use failure analysis for the understandingof ESD circuit operation, temperature analysis, power distribution,ground rule development, internal bus distribution, current pathanalysis, quality metrics, (connecting the theoretical to thepractical analysis);
• the failure of each key element of a technology from passives,active elements to the circuit, sub-system to package, highlightedby case studies of the elements, circuits and system-on-chip (SOC)in today€s  products. 

ESD: Failure Mechanisms and Models is a continuation ofthe author€s series of books on ESD protection. It is anessential reference and a useful insight into the issues thatconfront modern technology as we enter the Nano-electronic era.