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Scanning Electron Microscopy: Physics of Image Formation and Microanalysis (Springer Series in Optical Sciences, 45)

Scanning Electron Microscopy: Physics of Image Formation and Microanalysis (Springer Series in Optical Sciences, 45)
- Used Book in Good Condition
Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interactions. The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information.
Country USA
Brand Springer
Manufacturer Springer
Binding Paperback
ItemPartNumber biography
ReleaseDate 2010-12-01
UnitCount 1
EANs 9783642083723

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Country	USA
Brand	Springer
Manufacturer	Springer
Binding	Paperback
ItemPartNumber	biography
ReleaseDate	2010-12-01
UnitCount	1
EANs	9783642083723