Scanning Transmission Electron Microscopy of Nanomaterials : Basics of Imaging and Analysis
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Product Description
Scanning Transmission Electron Microscopy of Nanomaterials : Basics of Imaging and Analysis
The basics, present status and future prospects of high-resolution scanning transmission electron microscopy (STEM) are described in the form of a textbook for advanced undergraduates and graduate students. This volume covers recent achievements in the field of STEM obtained with advanced technologies such as spherical aberration correction, monochromator, high-sensitivity electron energy loss spectroscopy and the software of image mapping. The future prospects chapter also deals with z-slice imaging and confocal STEM for 3D analysis of nanostructured materials.Contents:
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- Introduction (N Tanaka)
- Historical Survey of the Development of STEM Instruments (N Tanaka)
- Basic Knowledge of STEM:
- Basics of STEM (N Tanaka and K Saitoh)
- Application of STEM to Nanomaterials and Biological Specimens (N Shibata, S D Findlay, Y Ikuhara and N Tanaka)
- Theories of STEM Imaging:
- Theory for HAADF-STEM and Its Image Simulation (K Watanabe)
- Theory for Annular Bright Field STEM Imaging (S D Findlay, N Shibata and Y Ikuhara)
- Electron Energy-Loss Spectroscopy in STEM and Its Imaging (K Kimoto)
- Density Functional Theory for ELNES in STEM-EELS (T Mizoguchi)
- Advanced Methods in STEM:
- Aberration Correction in STEM (H Sawada)
- Secondary Electron Microscopy in STEM (H Inada and Y Zhu)
- Scanning Confocal Electron Microscopy (K Mitsuishi and M Takeguchi)
- Electron Tomography in STEM (N Tanaka)
- Electron Holography and Lorentz Electron Microscopy in STEM (N Tanaka)
- Recent Topics and Future Prospects in STEM (N Tanaka)
Readership: Graduate students and researchers in the field of nanomaterials and nanostructures. Key Features: - Most advanced; befitting beginning graduate students
- Very convenient for advanced researchers who would like to use STEM and have a comprehensive understanding of the theory of image contrast and application details
- Spans from the basic theory to the applications of STEM
Technical Specifications
Country
USA
Author
Tanaka Nobuo
Binding
Kindle Edition
EISBN
9781783264711
Format
Kindle eBook
Label
ICP
Manufacturer
ICP
NumberOfPages
616
PublicationDate
2014-08-21
Publisher
ICP
ReleaseDate
2014-08-21
Studio
ICP



