Secondary Ion Mass Spectrometry SIMS IV: Proceedings of the

Secondary Ion Mass Spectrometry SIMS IV: Proceedings of the Fourth International Conference, Osaka, Japan, November 13–19, 1983 (Springer Series in Chemical Physics)

This volume contains full proceedings of the Fourth International Conference on Secondary Ion Mass Spectrometry (SIMS-IV), held in the Minoo-Kanko Hotel, Osaka, Japan, from November 13th to 19th, 1983. Coordinated by a local orÂ ganizing committee under the auspices of the international organizing comÂ mittee, it followed earlier conferences held in MUnster (1977), Stanford (1979), and Budapest (1981). The conference was attended by about 250 participants from 18 countries, and 130 papers including 24 invited ones were presented. Reflecting the rapÂ idly expanding activities in the SIMS field, informative papers were preÂ sented containing up-to-date information on SIMS and various related fields. The proceedings focussed upon six main issues: (1) Fundamentals of sputÂ tering and secondary ion formation. (2) Recent progress in instrumentation, including submicron SIMS and image processing. (3) SIMS combined with other surface analysis techniques. (4) Outstanding SIMS-related analytical methods such as laser-microprobe SIMS, sputtered neutral mass spectrometry, mass spectrometry of sputtered neutrals by multi-photon resonance ionization, and accelerator-based SIMS. (5) Organic SIMS and FAB which has recently become a rapidly expanding technique in pharmacy, biotechnology, etc. (6) Appl icaÂ tions of SIMS to various fields such as metallurgy, geology, and biology, including depth profiling of semiconductors, and analysis of inorganic mateÂ rials. As a venue for the exchange of ideas and information concerning all the above issues, the conference proved a great success.
Country USA
Brand Springer
Manufacturer Springer
Binding Paperback
ItemPartNumber black & white illustrations, bibliograph
ReleaseDate 2012-01-10
UnitCount 1
EANs 9783642822582

Country	USA
Brand	Springer
Manufacturer	Springer
Binding	Paperback
ItemPartNumber	black & white illustrations, bibliograph
ReleaseDate	2012-01-10
UnitCount	1
EANs	9783642822582

Secondary Ion Mass Spectrometry SIMS IV: Proceedings of the Fourth International Conference, Osaka, Japan, November 13–19, 1983 (Springer Series in Chemical Physics)

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