Spectroscopic Ellipsometry: Practical Application to Thin Film Characterization (Materials Characterization and Analysis Collection)

Spectroscopic Ellipsometry: Practical Application to Thin Film Characterization (Materials Characterization and Analysis Collection)

Product ID: 1606507273 Condition: New

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Product Description

Spectroscopic Ellipsometry: Practical Application to Thin Film Characterization (Materials Characterization and Analysis Collection)

Technical Specifications

Country
USA
Brand
Momentum Press
Manufacturer
Momentum Press
Binding
Paperback
ItemPartNumber
Refer to Sapnet.
ReleaseDate
2015-12-15T00:00:01Z
UnitCount
1
EANs
9781606507278