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Spectroscopic Ellipsometry: Practical Application to Thin Film Characterization (Materials Characterization and Analysis Collection)

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Spectroscopic Ellipsometry: Practical Application to Thin Film Characterization (Materials Characterization and Analysis Collection)
Country USA
Brand Momentum Press
Manufacturer Momentum Press
Binding Paperback
ItemPartNumber Refer to Sapnet.
ReleaseDate 2015-12-15
UnitCount 1
EANs 9781606507278

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