VLSI Test Principles and Architectures: Design for Testability (Morgan Kaufmann Series in Systems on Silicon (Hardcover))

VLSI Test Principles and Architectures: Design for Testability (Morgan Kaufmann Series in Systems on Silicon (Hardcover))

Product ID: B004NYAS1U Condition: New

No Stock / Cannot Import
Buy in USA

Product Description

VLSI Test Principles and Architectures: Design for Testability (Morgan Kaufmann Series in Systems on Silicon (Hardcover))

Technical Specifications

Country
USA
Brand
Morgan Kaufmann
Manufacturer
Morgan Kaufmann
Binding
Kindle Edition
ReleaseDate
2006-08-14T00:00:00.000Z
Format
Kindle eBook