Statistical Analysis of Spatial and Spatio-Temporal Point Patterns (Chapman & Hall/CRC Monographs on Statistics and Applied Probability)
| Country | USA |
| Brand | YML |
| Manufacturer | YML GROUP INC |
| Binding | Misc. |
| ItemPartNumber | 4164WHT |
| Model | 4164WHT |
| Color | White |
| Size | Small |
| UnitCount | 1 |
| UPCs | 833775000889 |
| EANs | 0833775000889 |
| ReleaseDate | 0000-00-00 |