for CMM Probe with Threaded Handle, Red Ball Head Porcelain Rod for Thread Shank, Non-Conductive Wear-Resistant Extension Rod, Lightweight(A-5004-2545)
for CMM Probe with Threaded Handle, Red Ball Head Porcelain Rod for Thread Shank, Non-Conductive Wear-Resistant Extension Rod, Lightweight(A-5004-2545)
Premium For CMM Probe With Threaded Handle: For threaded shank design featuring a lightweight red ball head and porcelain rod construction, delivering precise measurement capabilities for coordinate measuring machines across manufacturing and quality control applications, with non-conductive properties that protect delicate surfaces during inspection tasks.
Wear-Resistant Silicon Carbide Ball Technology: The red ball head combines exceptional durability with dimensional stability under fluctuations, while the porcelain rod material offers superior strength-to-weight ratio and built-in anti-collision protection, maintaining measurement accuracy throughout extended use in EDM processes and delicate For inspections.
8 Model Options With Specific Dimensions: Available configurations include ball diameters from 2mm to 5mm, rod lengths of 40mm or 50mm, and effective working radii ranging from 32.5mm to 50.0mm (models A-5004-3646, A-5004-2545, A-5004-6040, A-5004-0154, A-5003-0067, A-5003-0068, A-5004-0069, A-5003-0075), accommodating diverse measurement requirements and access constraints in complex part geometries.
Non- Construction Advantages: The porcelain rod's non-conductive and non-magnetic properties eliminate interference with electrical discharge machining surfaces and sensitive electronic components, while the hardest material composition suitable for most industrial applications provides reliable performance across automotive, aerospace, and For manufacturing sectors.
Light Transmission And Hardness Benefits: The probe's optical allows visual verification during setup procedures, combined with industry-standard stylus technology that delivers consistent hardness ratings for accurate touch-trigger measurements, maintaining repeatable For across hundreds of inspection cycles without For marking or probe tip degradation.